Abratech’s patents and patent applications are available for licensing on fair and mutually agreeable terms. For further information, please contact vmeyer at abratech dot com or call (415) 381-2615.
PATENTS
- Jewett et al., US Patent 5,687,724, issued November 18, 1997 for “Apparatus and Method for Determining Variations in Measured Physical Parameters of Signal-Generators.”
Abstract: The invention relates to machines and methods for determining variations in estimated signal-generator parameters derived from signals created by signal-generators, such as signal-generators within organs of the body, such as brain, head, spinal cord, and muscles. The invention is particularly useful when more than one signal generator is non-zero in part or all of the time-interval analyzed. The parameters of a signal-generator that may be of interest include magnitude, location and/or orientation, over single or multiple points in time.
- Amir et al., US Patent 5,701,909, issued December 30, 1997 for ÂMachine and Method for the Determination of Nervous-System-Generator Parameters Using Lead Fields.Â
Abstract: The invention relates to machines and methods for converting recordings of electric potentials into nervous-system-generator parameters that can be used by clinicians and researchers to evaluate generators of central or peripheral nervous system activity. The machine and method utilize as inputs physiological recordings made at sites remote from the generator, data on shapes of boundaries, locations of recording points and electrical conductivity of volumes to be analyzed. The invention teaches how to compute the right function values corresponding to electric potentials and/or electric fields across a pair of electrodes due to unit source current by the use of the Lead Field Analysis in the boundary element method.
- Jewett, Pub. No. US 2003/0055609 A1, Pub. Date: March 20, 2003, for ÂQSD Apparatus and Method for Recovery of Transient Response Obscured by Superposition. Notice of Allowance issued April 28, 2004. The invention in this basic QSD application is a machine and method for testing a system having a transient response that is
